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The atomic force microscope (AFM) has become a standard and wide spread instrument for characterizingnanoscale devices and can be found in most of today's research and development areas. The NanoBitsproject provides exchangeable and customizable scanning probe tips that can be attached to standard AFMcantilevers offering an unprecedented freedom in adapting the shape and size of the tips to the su ...

Carbon nanotubes are materials with a set of unique electrical, mechanical, surface and thermal properties. Yet their adoption in mainstream applications has been limited by mass production and device integration. This project develops the first 300mm wafer-scale equipment for production of carbon nanotubes on surfaces. The project will cover the design, engineering, process control, quality assur ...