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The objective of this project is to develop an innovative and novel combination of a new TOF-SIMS with substantially improved lateral resolution and sensitivity, combined with a new metrological high resolution SFM. The two techniques provide complementary information on nanoscale surface chemistry and surface morphology. In combination with a layer by layer removal of material using low energy sp ...

The ability to perform scanning tunnelling spectroscopy simultaneously with a measurement of the vertical and lateral tip-sample interaction force and energy dissipation on selected atomic or molecular sites is the next revolution in scanning probe microscopy and will revolutionise entire areas of surface science. The aim is to develop, manufacture and commercialise a new UHV low temperature mul ...