Combined SIMS-SFM Instrument for the 3-Dimensional Chemical Analysis of Nanostructures
(3D NanoChemiscope)
Start date: Sep 15, 2008,
End date: Jan 14, 2013
PROJECT
FINISHED
The objective of this project is to develop an innovative and novel combination of a new TOF-SIMS with substantially improved lateral resolution and sensitivity, combined with a new metrological high resolution SFM. The two techniques provide complementary information on nanoscale surface chemistry and surface morphology. In combination with a layer by layer removal of material using low energy sputtering, quantitatively measured by SFM, this combined ultra-high vacuum (UHV) instrument will be unique for the 3-dimensional chemical characterisation of nanostructured inorganic as well as organic materials with down to at least 10 nm lateral resolution and down to 1 nm depth resolution. Joint by a novel software for the calculation and display of 3-dimensional distributions of all chemical species, this leads to a totally new “3D NanoChemiscope”.
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Coordinator
- Ewald Niehuis
- HEISENBERGSTRASSE 15 48149 MUNSTER (Germany)
7 Partners Participants
- Marco Romanelli
- Ueberlandstrasse 129 8600 DUBENDORF (Switzerland)
- Roland Knechtle
- Ueberlandstrasse 129 8600 DUBENDORF (Switzerland)
- Patrick Bertrand
- PLACE DE L UNIVERSITE 1 1348 LOUVAIN LA NEUVE (Belgium)
- Daniel Bourgeois
- RUE DE BRUXELLES 61 5000 NAMUR (Belgium)
- Herbert Hutter
- Karlsplatz 13 1040 WIEN (Austria)
- Pavel Zemanek
- KRALOVOPOLSKA 147 61264 BRNO (Czech Republic)
- Jasper Michels
- ANNA VAN BUERENPLEIN 1 2595 DA DEN HAAG (Netherlands)