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Exchangeable and Customizable Scanning Probe Tips (NanoBits)

Start date: Sep 1, 2010, End date: Aug 31, 2013,

The atomic force microscope (AFM) has become a standard and wide spread instrument for characterizingnanoscale devices and can be found in most of today's research and development areas. The NanoBitsproject provides exchangeable and customizable scanning probe tips that can be attached to standard AFMcantilevers offering an unprecedented freedom in adapting the shape and size of the tips to the su ...
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